Computer simulation of semiconductor field ion images.
نویسندگان
چکیده
منابع مشابه
Geometrical Analysis of Field - Ion Images
Field ion microscopy (FIM), transmission electron microscopy (TEM) and computer simulation techniques have been used to experimentally investigate the field ion image geometry. Electron micrographs and electron diffraction patterns were obtained from tungsten specimens after controlled amounts of field evaporation. From a knowledge of the changes in the image dimensions as a function of the var...
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ژورنال
عنوان ژورنال: SHINKU
سال: 1985
ISSN: 0559-8516,1880-9413
DOI: 10.3131/jvsj.28.631